Hall Resistance, van der Pauw Test Method - Tutorial

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Abstract

The van der Pauw Hall Resistance test method offers exceptional insight into intrinsic electronic properties of nanomaterials, including graphene, and those of few layers graphene. In comparison, the measurements in accordance with the classical Hall-bar resistance standards require complex sample preparation procedures, test structure, and skills that often are not available to manufacturers of the Graphene related materials and products, such as graphene flakes reprocessed into ink formulations and 2D composites. The van der Pauw method employs a simple symmetric testing structure for which the geometrical dimensions do not need to be known. The presented procedure is based on simplified sets of the classical Hall Resistance mathematical equations permitting Hall voltage data fitting to linear plots as a function of magnetic field. Such graphical representation of data simplifies evaluation of statistical uncertainty, allows identification of the majority charge carriers and distinguishing between semiconducting and metallic character of graphene related materials. In the case of truly 2D charge transport, a quantized resistance can be identified. The method is suitable for quality control of practically relevant nano-carbon materials such as graphene inks and composites that are obtained from a wide range of scalable, low-cost, and commercial technologies. Despite its simplicity the method can be used to identify quantum Hall resistance in the case where the charge transport is truly confined to two dimensions (2D) and becomes quantized.

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Nanoelectronics and Materials characterization

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