Oak Ridge National Laboratory
01/16/2025 | News release | Distributed by Public on 01/16/2025 10:02
Next-level semiconductor testing available
ORNL automated testing platform supports new semiconductor development
January 16, 2025
ORNL researchers have developed an Autonomous Configurable Component Evaluation Power Test platform, called ACCEPT, enabling automated characterization of semiconductor devices. Credit: Alonda Hines/ORNL, U.S. Dept. of Energy
Researchers at Oak Ridge National Laboratory have developed a new automated testing capability for semiconductor devices, which is newly available to researchers and industry partners in the Grid Research Integration and Deployment Center, or GRID-C.
Semiconductors are considered the heart of the power electronics that shift current and voltage levels as electricity travels from sources like the electric grid and solar panels to where it's used, such as homes, businesses and vehicle charging stations.
ORNL can now test the performance of new semiconductors handling up to 10,000 volts or 2,000 amps as they operate at different voltages, currents and temperatures. Hundreds of data points can be collected safely in minutes instead of hours, with post-processing data analysis provided by ORNL experts.
"These capabilities are pretty advanced, even without automation," said ORNL project lead Prasad Kandula. "Very few facilities have this capability, and it's not a service offered commercially. We can help companies and researchers quickly get a full idea of how products are going to work for different applications."
To learn more about participating in the GRID-C Tech Collaboration program, click here.