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07/07/2025 | Press release | Archived content

Primary activity measurement of an Am-241 solution using microgram inkjet gravimetry and decay energy spectrometry

Published
July 7, 2025

Author(s)

Ryan Fitzgerald, Bradley Alpert, Denis Bergeron, Max Carlson, Richard Essex, Kelsey Morgan, Shinichiro N. Muramoto, Svetlana Nour, Galen O'Neil, Daniel Schmidt, Gordon Shaw, Daniel Swetz, R Verkouteren

Abstract

We demonstrate a method for radionuclide assay that is spectroscopic with 100 % counting efficiency for alpha decay. Advancing both cryogenic decay energy spectrometry (DES) and drop-on-demand inkjet metrology, a solution of Am-241 was assayed for massic activity (of order 100 kBq/g) with a relative combined standard uncertainty less than 1 %. We implement live-timed counting, spectroscopic analysis, validation by liquid scintillation (LS) counting, and confirmation of quantitative solution transfer. Experimental DES spectra are well modeled with a Monte Carlo simulation. The model was further used to simulate Pu-238 and Pu-240 impurities, calculate detection limits, and demonstrate the potential for tracer-free multi-nuclide analysis, which will be valuable for new cancer therapeutics based on decay chains, Standard Reference Materials (SRMs) containing impurities, and more widely in nuclear energy, environmental monitoring, security, and forensics.
Citation
Metrologia
Pub Type
Journals

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Keywords

radionuclide metrology, quantitative analysis, radioactivity, decay energy spectrometry, cryogenic calorimetry, inkjet gravimetry, transition edge sensor, TES
Superconductors, Radiation, Physics, Nuclear physics and Materials characterization

Citation

Fitzgerald, R. , Alpert, B. , Bergeron, D. , Carlson, M. , Essex, R. , Morgan, K. , Muramoto, S. , Nour, S. , O'Neil, G. , Schmidt, D. , Shaw, G. , Swetz, D. and Verkouteren, R. (2025), Primary activity measurement of an Am-241 solution using microgram inkjet gravimetry and decay energy spectrometry, Metrologia, [online], https://doi.org/10.1088/1681-7575/adecaa, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=958017 (Accessed July 9, 2025)

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